X-ray Fluorescence Spectrometers

Model: Malvern Panalytical Epsilon 4

Location: Brauer Hall 014

Description: The Malvern Panalytical Epsilon 4 utilizes X-ray fluorescence (XRF), a non-destructive analytical technique that determines the elemental composition of materials. When a sample is exposed to high-energy X-rays, its atoms emit secondary X-rays, or fluorescence, which are characteristic of the elements present. The spectrometer detects these emitted X-rays and analyzes their energies to identify and quantify the elements in the sample. This method is effective for analyzing a variety of materials, including solids, liquids, and powders, and requires minimal sample preparation.

Capabilities:

• Analyzes elements from sodium (Na) to americium (Am) in concentrations from ppm to 100%.
• Features a powerful excitation system and high-resolution detector.
• Handles samples of various shapes and sizes.
• Energy-dispersive technology for rapid data acquisition.

Typical Uses:

• Fundamental and applied research across materials science, geology, chemistry, and environmental science.Materials research, environmental analysis, and industrial quality control.
• Investigating the elemental composition of minerals, alloys, polymers, and other substances.
• Supporting the development of new materials and understanding material properties.
• Analyzing various sample types quickly and accurately for experimental and analytical research.