Atomic Force Microscope (AFM)
Veeco Di 3100
Model: Veeco Di 3100
Location: 017 Brauer Hall
Description: AFM is capable of nanoscale surface topography and morphology measurements of a range of different surface types producing high resolution, three-dimensional images by scanning a sharp probe over the sample surface.
Capabilities:
- Metrology sub-Angstrom resolution.
- 100×100 µm lateral dynamic range.
- 5 µm vertical dynamic range.
- Tapping Mode.
- Contact Mode.
- Allows for nanometer –scale investigation of cells and molecules.
Typical uses:
- Imaging of almost any type of surface, including polymers, ceramics, composites, glass and biological samples.
- Image the topography of soft biological materials in their native environments.
- Probe the nano-mechanical properties of cells and extracellular matrices, including their intrinsic elastic modulus and receptor-ligand interaction.
Fees
Per hour rate | Trained user | By our service |
Other departments at WUSTL | $25 | $125 |
Other universities | $40 | $100 |
Industry Corporate | $80 | $200 |